Test Evolution Ltd

Test Evolutions Ltd’s chip laser final test systems have been developed to provide a highly versatile solution for the automated testing of laser chip on carrier or chip on substrate devices.

Laser devices are loaded onto a device carrier which is then inserted into the system.  A typical device carrier will hold twenty lasers.  User defined electrical and optical tests can then automatically be run on each device in the carrier in sequence to provide a full LIV and spectral analysis of each laser.  An integrating sphere and lensing arrangement is moved between devices on a linear translation stage to provide optical and spectral measurements.  An optional extra is the inclusion of a infra red camera on this stage to provide measurement and analysis of the far field characteristics of the lasers.  The temperature of devices is stabilised using temperature controlled re-circulating water.

Electrical contact is made to the devices under test using a spring probe  assembly mounted on a precision mechanical jig.  The spring probe assembly can be removed from the jig meaning that differing devices can be catered for simply by using an alternate device carrier and spring probe assembly.

 

Test Evolution’s existing test software provides a versatile platform for this system.  The software is centred around a powerful test editor which allows the test engineer to quickly create device specific tests.

 

The tests conducted on a device and the analysis of the tests results have been broken down into individual test functions within the editor.  The intention within each test function is to allow the engineer to set any of the variables relating to the test, none are hard coded within the software.  The result of one test function can also be passed as an input to another test function.  Within the test editor test functions are chained together to define a test sequence or test suite.  Using this method complicated test suites can quickly be defined.  Many test suites can be created and grouped under different device types.  Once the test suites are defined the operator only has to select the particular test suite to run and then press ‘go’.  Test Evolution are happy to provide new test functions if required or modify existing ones to your requirements.

The results of each test are stored to file and a database.  The test functions can also be configured to save results to an existing production database.  The system allows the setting of security levels on a per user basis so that only authorised personnel can access certain functions.  At the end of each test a results sheet can be printed for each device tested.  The results printed are defined by the test engineer within the test editor.  The format of this printout can be modified to your requirements if desired.

 

In our experience it is unusual for the above system not to need some level of design modifications to satisfy a particular requirement or specification.  It may be more appropriate to consider the system description above to represent a generic platform which can quickly and easily be modified to suit a specific requirement.  If the system is of interest please call +44 (0)1969 625456 or email sales@testevolution.co.uk to discuss your application further.

 

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